Thin film fundamentals

“””Thin Film Fundamentals”” by A. Goswami is a comprehensive textbook that delves into the science and technology of thin solid films. Published by New Age International Publishers, the book spans 556 pages and is available in both hardcover and paperback editions.

Key Features:

Comprehensive Coverage: The book addresses various aspects of thin films, including nucleation, growth processes, structural properties, and phase transitions. It also explores the behavior of films under electrical, electromagnetic, and other fields, considering factors like film thickness and temperature.

Focus on Unique Film Properties: Goswami emphasizes the distinct characteristics of thin films compared to bulk materials, discussing surface states, contact potential, defect concentrations, and other phenomena that influence film behavior.

Analytical Techniques: The book details special techniques used for measuring thin film properties, providing insights into experimental methods and necessary precautions.”